X‑VIEW 2D PAN CEPH is the complete 2‑in‑1 configuration, combining high-quality panoramic imaging and advanced cephalometric acquisition in one seamlessly integrated system.
Designed for demanding dental and orthodontic workflows, it enables practices to perform routine panoramic examinations, specialized projections and full-format cephalometric studies without changing equipment or interrupting the clinical workflow.
With two dedicated detectors—one optimized for panoramic imaging and one for cephalometric acquisition—each examination benefits from technology specifically designed for its purpose. The result is uncompromised performance, operational efficiency and exceptional versatility within a single platform.
DUAL-DETECTOR TECHNOLOGY
The high-resolution CMOS detector delivers detailed and consistent panoramic images, while the dedicated 25 × 30 cm Single‑Shot DR detector captures cephalometric projections in just 200–500 milliseconds.
Single‑Shot technology acquires the entire cephalometric image in one rapid exposure, helping minimize the effects of patient movement and ensuring a clear, geometrically consistent representation of the craniofacial structures.
DEEP‑VIEW + DEEP‑AI
X‑VIEW 2D PAN CEPH integrates seamlessly with Deep‑View, creating a smooth digital workflow from image acquisition to visualization and management.
When combined with the optional Deep‑AI module, artificial intelligence automatically enhances panoramic images by optimizing clarity, contrast, sharpness and image consistency—while preserving the original anatomical information.